lineagekeeper's genealogy
genealogy of the drew, huggard, young, merrill families
First Name:  Last Name: 
[Advanced Search]  [Surnames]

Morgan C. Frazier

Male Abt 1836 - Yes, date unknown


Personal Information    |    Sources    |    Event Map    |    All    |    PDF

  • Born  Abt 1836  Of, Kirklin, Clinton, Indiana Find all individuals with events at this location 
    Gender  Male 
    Census  1910  Kirklin, Clinton, Indiana Find all individuals with events at this location  [1
    Federal 
    Died  Yes, date unknown 
    Notes 
    • !Bennett Family #874372
    Person ID  I6509  7_families
    Last Modified  19 May 2002 

    Family  Emily E. Conyers,   b. 8 May 1840, , Warren, Ohio Find all individuals with events at this location,   d. Yes, date unknown 
    Married  28 Nov 1867  Kirklin, Clinton, Indiana Find all individuals with events at this location 
    Children 
     1. Ulah G. Frazier,   b. 27 Sep 1868, Of Kirklin, Boone, Indiana Find all individuals with events at this location,   d. 12 Dec 1869
    >2. Effie M. Frazier,   b. 20 Nov 1870, Of, Kirklin, Clinton, Indiana Find all individuals with events at this location,   d. Yes, date unknown
    >3. James R. Frazier,   b. 15 May 1873, Of Kirklin, Boone, Indiana Find all individuals with events at this location,   d. Yes, date unknown
    Last Modified  21 Feb 2005 
    Family ID  F3394  Group Sheet

  • Event Map
    Link to Google MapsBorn - Abt 1836 - Of, Kirklin, Clinton, Indiana Link to Google Earth
    Link to Google MapsMarried - 28 Nov 1867 - Kirklin, Clinton, Indiana Link to Google Earth
    Link to Google MapsCensus - Federal - 1910 - Kirklin, Clinton, Indiana Link to Google Earth
     = Link to Google Maps 
     = Link to Google Earth 
    Pin Legend  : Address       : Location       : City/Town       : County/Shire       : State/Province       : Country       : Not Set

  • Sources 
    1. [S229] Indiana, Clinton, Kirklin - 1910 - Federal Census, Indiana, Clinton, Kirklin, (www.ancestry.com), Morgan C. Frazier, 68, borrn in Indiana, (Reliability: 3).