Anna Bailey^{[1, 2]}

1777 - 1827

• Born	16 Mar 1777	Little Compton, Newport, Rhode Island   [3]
  Gender	Female
  _UID	D741DFFBFBDE452681206C67E7758F16AB28
  Died	9 Jul 1827  [3]
  Person ID	I86766	Burgess
  Last Modified	14 Apr 2009

  
  

  Family	Cornelius Simmons Burgess,   b. 15 Oct 1778, Little Compton, Newport, Rhode Island ,   d. 23 Nov 1859, New Bedford, Bristol, Massachusetts
  Married	21 Mar 1802	Little Compton, Newport, Rhode Island   [2, 3]
  Children	> 1. Obadiah Burgess,   b. 1804,   d. 23 May 1840, New Bedford, Bristol, Massachusetts   2. Hannah Burgess,   b. Abt 1805, Little Compton, Newport, Rhode Island ,   d. Infant > 3. Charles C. Burgess,   b. 1806, New Bedford, Bristol, Massachusetts ,   d. 16 Jan 1851   4. Peter F. Burgess,   b. 1808, Little Compton, Newport, Rhode Island ,   d. 29 Mar 1825 > 5. Sarah Ann Burgess,   b. 18 May 1810, Little Compton, Newport, Rhode Island ,   d. Yes, date unknown   6. William H. Burgess,   b. 14 Feb 1814, Little Compton, Newport, Rhode Island ,   d. 1885   7. Mary Burgess,   b. Mar 1816, Little Compton, Newport, Rhode Island ,   d. Yes, date unknown
  Last Modified	14 Apr 2009
  Family ID	F32353	Group Sheet

  
  

• Event Map		Born - 16 Mar 1777 - Little Compton, Newport, Rhode Island Married - 21 Mar 1802 - Little Compton, Newport, Rhode Island  = Link to Google Maps   = Link to Google Earth
  Pin Legend	: Address       : Location       : City/Town       : County/Shire       : State/Province       : Country       : Not Set

  
  

• Sources

  [S139] Burgess Genealogy - Hiam, Katharine W. Hiam, (Boston: New England Historic Genealogical Society, 1997), Lee Drew library., Page 69 (Reliability: 3). [S138] Little Compton families, Wilbour, Benjamin Franklin, (Little Compton [Rhode Island] : Little Compton Historical Society, 1967 (College Hill Press : Providence, R.I.). FHL Book #974.56/L2 D3w), FHL Book #974.56/L2 D3w., 135 (Reliability: 3). [S15] Burgess Genealogy, Ebenezer Burgess, (Boston : Press of T.R. Marvin & Son, 1865), Lee Drew library., Page 52 (Reliability: 3).